兼具变通性与安详性,耶勒挑供各栽光电器件的老化及寿命测试解决方案

原标题:兼具变通性与安详性,耶勒挑供各栽光电器件的老化及寿命测试解决方案

2020年9月9-11日,在第22届中国国际光电博览会上,上海耶勒商贸有限公司将展出半导体激光器的老化及寿命测试编制、半导体激光器的LIV测试编制、半导体激光器的特性检测编制等产品。

半导体激光器的老化及寿命测试编制( Laser diode burn-in and life testing system)

此编制能够同时已足老化测试和寿命测试两栽需要,并可兼容差别规格的待测器件,用户可议定变通的柔件竖立自定义差别的老化和测试条件并获取各栽有关的数据(温度/电流/电压/功率…)用于生产或研发主意。

The system is capable of both life-test and burn-in for laser diodes. Multiple photonic device types may be tested at the same time, using test recipes which may be configured to measure temperature, current, voltage or optical power.

关键指标(Key Features):

·可用于老化/寿命测试/特性检测

·Can be used for burn-in, life test and characterisation

·可为待测器件挑供超过10,000 幼时以上的安详坦然的不中止测试环境

·Run devices under test (DUT) for over 10,000 continuous hours

·可按用户需要挑供可视化图外以表现各栽测试数据

·Graph all your test data including LIV sweep analysis and spot measurements

展开全文

·模块化温区限制

·Multiple temperature control–each module is independent

·声援ACC模式老化及寿命测试功能

·Monitored burn-in with ACC and LIV test modes

·ACC限制模式

·Control Modes: ACC

·可挑供基于老化测试效果的自动化数据分析和计算

·In addition to burn-in, the system may be used to perform device parameter tests for evaluation of a device

·变通的编制架构可实现差别形态器件的兼容

·Flexibility for other products and uses: it is possible to run different device types simultaneously in the system

半导体激光器的LIV测试编制( Laser diode LIV test system )

在Yelo的LIV测试设备上能够行使老化或寿命测试编制中的夹具对待测器件的LIV特性进走测试分析。

loaded into a Yelo module. This module can also be used with the Burn-In / Life Test system.

LIV测试数据对于半导体激光器的出厂郑重性评价至关主要,主要用于评价待测器件的做事特性,议定为器件挑供安详坦然的驱动电流,以传感器互助高精度仪外测量器件的电压及出光功率,最后搜集有关数据并可自动绘制待测器件的LIV弯线。

The Yelo LIV Tester allows LIV measurements to be taken from devices A light-current-voltage (LIV) test is one of the essential tests that a laser diode must go through to ensure its reliability for post-production use.

This test will help to verify the operating characteristics of a laser device. The test works by driving current to the laser diode and measuring the resulting voltage and light output. The results are then plotted into a graph, known as an‘LIV curve’.

半导体激光器的特性检测编制(Laser diode characterization system)

Yelo的半导体激光器的特性检测编制可实现自动化的光电特性检测,用户将待测产品装载至TEC控温的器件夹具上后,在柔件上选择预先编辑益的测试程序,产品展示单击启动即可望到编制自动操作夹具别离与差别的测试平台(LIV/光谱/远场/近场…)耦相符后挨次完善指定的测试项现在。

The Yelo Laser Diode Characterization system performs automated characterization of a laser device. The system will allow the operator to load a single packaged Laser device into a TEC controlled fixture mount. Each test station (LIV, Spectrum, Far Field/Beam Divergence) will then automatically align with the Laser Device in a sequential order and perform the automated tests required of each station.

关键指标(Key Features):

·CW模式 [ CW drive]

·QCW模式(脉冲驱动) [ QCW drive (pulsed)]

·密封腔体 [ Light tight enclosure

·TEC和/或水冷控温 [ Temperature control (Tec and water)]

·TEC驱动 [ TEC drive]

·UPS电源珍惜 [ UPS Protection circuitry]

·矮耽延 [ Low transients]

关于 耶勒商贸

上海耶勒商贸有限公司是由Yelo Ltd注册于上海的全资子公司。Yelo行为在全球周围内的走业龙头企业,致力于为用户挑供各栽光电器件的老化、寿命测试及特性检测解决方案。吾们设计生产的老化及测试编制既有用于单通道1A以下器件的幼功率器件,也有用于单通道高达500A的大功率器件,可声援的待测器件封装形态包含CoC/TO/MCC/CoS/VCSEL以及其他各栽标准或非标准封装。

Yelo Shanghai Trading Company is WOFE registered by Yelo Ltd, NI, a global leader in optoelectronic burn-in, life test and characterization systems. We manufacture burn-in, life testing and characterization equipment for low-power laser diodes up to 1A, including: on-chip carriers, TO Can, VCSEL and custom packages. Yelo also provides high-power aging, life testing and characterization equipment for devices and packages up to 500A; chips on MCCP and Submount.

公司总部位于英国北喜欢尔兰,设计生产测试等均在总部完善,上海的子公司主要承担国内及周边地区的售前售后有关客户声援。

The company is headquartered in the United Kingdom but recently opened a sales office in Shanghai.

CIOE新闻通信展是亚太地区最有影响力的通信技术专科展览会,展会将荟萃展现新闻通信走业的新产品、新技术、新趋势及新行使,并着力为通信芯片商、器件商、设备商、工程商、运营商等企业打造集商贸洽谈、国际交流及品牌展现为一体的专科交流平台。

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posted @ 20-07-06 12:53  作者:admin  阅读量:

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